EZVIZ DL50FVS named Export Product of the Year at the 2025 Asian Export Awards for its self-manufactured reliability and next-generation accessibility

EZVIZ DL50FVS as the 2025 Asian Export Awards Winner EZVIZ DL50FVS wins the 2025 Asian Export Awards. SINGAPORE, Nov. 19, 2025 (GLOBE NEWSWIRE) — The DL50FVS has been officially named a winner at the 2025 Asian Export Awards, earning one of the industry’s most hard-fought and selective recognitions. This accolade underscores the DL50FVS’ unparalleled strength […]

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Quantexa Named as a Category Leader in Chartis Research’s 2025 AML Transaction Monitoring and KYC Solutions Reports

Decision Intelligence pioneer recognized for leadership in explainable AI, real-time behavioral monitoring, and contextual risk intelligence LONDON, Nov. 19, 2025 (GLOBE NEWSWIRE) — Quantexa, a global pioneer in Decision Intelligence, has been recognized as a Category Leader in Chartis’ RiskTech Quadrant for anti-money laundering (AML) transaction monitoring solutions and RiskTech Quadrant for KYC Solutions, 2025. Chartis Research […]

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Quantexa Announces General Availability of Quantexa Unify for Microsoft Fabric

AI-powered integration seamlessly delivers unified, trusted data for analytics and decision-making within the Microsoft Fabric platform LONDON, Nov. 18, 2025 (GLOBE NEWSWIRE) — Quantexa, the global pioneer in Decision Intelligence (DI), today announced the general availability of Quantexa Unify for Microsoft Fabric, marking a major milestone in helping enterprises build connected, high-quality data estates to […]

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International Air Chiefs Gather for the 12th DIACC in Dubai

DUBAI, United Arab Emirates, Nov. 18, 2025 (GLOBE NEWSWIRE) — Under the patronage of His Highness Sheikh Mohammed bin Rashid Al Maktoum, Vice President and Prime Minister of the UAE and Ruler of Dubai, His Excellency Mohamed bin Mubarak bin Fadhel Al Mazrouei, UAE Minister of State for Defence Affairs, inaugurated the 12th edition of […]

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Nearfield Instruments Signs Multi-Year Development Project to Advance Semiconductor Metrology

ROTTERDAM, The Netherlands, Nov. 18, 2025 (GLOBE NEWSWIRE) — Nearfield Instruments, the leader in 3D, non-destructive, in-line process control solutions based on scanning probe technology, today announced a strategic development project to accelerate innovation in semiconductor metrology. As part of a multi-year collaboration, Nearfield Instruments will deploy its flagship system, QUADRA, at Imec’s advanced R&D facility […]

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